Research in Engineering and Aviation

Modeling single- and multiple-electron resonances for electric-field-sensitive scanning probe

November 2008

Author(s): S. H. Tessmer, I. Kuljanishvili

Journal: Nanotechnology, 445503, 2008. DOI: 10.1088/0957-4484/19/44/445503

Abstract

We have developed a modeling method suitable for analyzing single- and multiple-electron resonances detected by electric-field-sensitive scanning probe techniques. The method is based on basic electrostatics and a numerical boundary-element approach. The results compare well to approximate analytical expressions and experimental data.